Afshar, Amir. <br/><br/>
Principles of semiconductor network testing / 
Amir Afshar. 
 - Boston :  Butterworth-Heinemann,  c1995. 
 - xiv, 213 p. :  ill. ;  25 cm. 
<br/><br/><label>ISBN: </label>0750694726  
<br/><br/><label>Subjects--Index Terms: </label>Integrated circuits--Testing.  Semiconductors--Testing. 
<br/><br/><label>Dewey Class. No.: </label>621.3815/48  / AFS