TY  - BOOK
AU  - Afshar,Amir
TI  - Principles of semiconductor network testing
SN  - 0750694726 
U1  - 621.3815/48 
PY  - 1995///
CY  - Boston
PB  - Butterworth-Heinemann
KW  - Integrated circuits--Testing
KW  - Semiconductors--Testing
ER  -