David, Rene <br/><br/>
Random testing of digital circuits  theory and applications 

 - New York  Marcel Dekker  1998 
 - xix, 475p. 
<br/><br/><label>ISBN: </label>0-8247-0182-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>621.3815--Digital integrated circuits - testing
<br/><br/><label>Universal Decimal Class. No.: </label>621.3815  / DAV