Chakraborty, Kanad <br/><br/>
Fault - tolerance and reliability techniques for high density random access memories 

 - New Delhi  Prentice Hall  2002 
 - 426p. 
<br/><br/><label>ISBN: </label>8120322142 
<br/><br/><label>Subjects--Index Terms: </label>Integrated circuits  621.38.049.77 
<br/><br/><label>Dewey Class. No.: </label>621.38.049.77  / CHA