TY  - GEN
AU  - Chakraborty, Kanad
AU  - Mazumder, Pinaki
TI  - Fault - tolerance and reliability techniques for high density random access memories
SN  - 8120322142
U1  - 621.38.049.77 
PY  - 2002///
CY  - New Delhi
PB  - Prentice Hall
KW  - Integrated circuits
KW  - 621.38.049.77
ER  -