Wang, laung-Terng [ed.] <br/><br/>
VLSI test principles and architectures:  design for testability  

 - Amsterdam  Elsevier  2006 
 - xxx, 777p. 
 - (Morgan Kaufmann series in systems on silicon) .
<br/><br/><label>ISBN: </label>0-12-370597-5 
<br/><br/><label>Subjects--Index Terms: </label>Integrated circuits-very large scale integration-testing  Integrated circuits-very large scale integration-design 
<br/><br/><label>Universal Decimal Class. No.: </label>621.3.049.77  / WAN