Foster, A. <br/><br/>
Scanning probe microscopy: atomic scale engineering by forces and currents 

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 - New York  Springer  2006 
 - xiv, 281p   
<br/><br/>   
<br/><br/><label>ISBN: </label>9780387400907 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Index Terms: </label>Scanning probe microscopy 
<br/><br/><label>Dewey Class. No.: </label>620.186