TY  - BOOK
AU  - Foster, A.
AU  - Hofer, W.
TI  - Scanning probe microscopy: atomic scale engineering by forces and currents
SN  - 9780387400907
U1  - 620.186 
PY  - 2006///
CY  - New York
PB  - Springer
KW  - Scanning probe microscopy
ER  -