Fleetwood, Daniel M. <br/><br/>
Defects in microelectronic materials and devices 

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 - London  CRC  2009 
 - xvi,753p.   
<br/><br/>   
<br/><br/><label>ISBN: </label>9781420043761 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Index Terms: </label>Microelectronics-materials-testing  Metal oxide semiconductor field effect transistors-testing  Integrated circuits-defects 
<br/><br/><label>Dewey Class. No.: </label>621.3.049.77