TY  - BOOK
AU  - Fleetwood, Daniel M.
AU  - Pantelides,Sokrates T.
TI  - Defects in microelectronic materials and devices
SN  - 9781420043761
U1  - 621.3.049.77 
PY  - 2009///
CY  - London
PB  - CRC
KW  - Microelectronics-materials-testing
KW  - Metal oxide semiconductor field effect transistors-testing
KW  - Integrated circuits-defects
ER  -