Weirich, Thomas E.,ed <br/><br/>
Electron crystallography  novel approaches for structure determination of nanosized materials  
ed.by Thomas E Weirich, Jonos L Labar, Xiaodong Zou  
 - Netherlands   Springer   2004 
 - 536p. 
 - NATO science series  .
<br/><br/><label>ISBN: </label>9781402039195 
<br/><br/><label>Subjects--Index Terms: </label>Electron microscopy   Electron diffraction  
<br/><br/><label>Universal Decimal Class. No.: </label>548:537.533.35  / WEI