Servin, Manuel <br/><br/>
Fringe pattern analysis for optical metrology  theory, algorithms and applications 
Manuel Servin, J Antonio Quiroga and J Moises Padilla 
 - Germany  Wiley-VCH  2014 
 - xvi, 327p. 
<br/><br/><label>ISBN: </label>9783527411528 
<br/><br/><label>Subjects--Index Terms: </label>Interferometry Metrology Optical measurements Diffraction patterns 
<br/><br/><label>Universal Decimal Class. No.: </label>535.241  / SER