Tolansky, S <br/><br/>
Multiple beam interferometry of surfaces and films 

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 - New York  Dover  1970 
 - vi, 186p., illus.   
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<br/><br/><label>Subjects--Index Terms: </label>interference  Analysis, spectrum  Spectra  Spectrochemistry  Spectroscopy  Mass spectroscopy  NMR spectroscopy  IR spectroscopy  Infrared spectroscopy  nmr  Optics  Astrophysics  Chemistry  Radiation  Light  Photometry  Optics  Colour  Optical storage devices  Spectrum analysis  Phosphoresence  Spectroscopy  Physics  Optical physics 
<br/><br/><label>Dewey Class. No.: </label>535.41