Bowkett, K M <br/><br/>
Field-ion microscopy 

 - 
 - Amsterdam  North-Holland Publishing Company  1970 
 - x, 257p.   
<br/><br/>  Defects in crystalline solids 
<br/><br/><label>ISBN: </label>
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Index Terms: </label>Solid-state physics 
<br/><br/><label>Dewey Class. No.: </label>539.2