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	1.	No cover image available Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements by Rupa R. Pai [] Sudha Kartha, C Edition: Material type: Text; Format: large print ; Nature of contents: ; Literary form: Not fiction ; Audience: Juvenile; Publication details: Kochi Department of Physics, CUSAT 2004 Availability: Items available for reference: University Library: Not for loan (1)Call number: 539.216.2 RUP. Add to cart (remove)
	2.	No cover image available Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements by Rupa, R. Pai Sudha Kartha, C (Guide) Material type: Text; Format: print ; Literary form: Not fiction Publication details: Cochin: Cochin University of Science and Technology, 2004 Availability: Items available for reference: Department of Physics: Not for loan (1)Call number: PH. D. Add to cart (remove)
	3.	No cover image available Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements by Rupa, R. Pai Sudha Kartha, C (Guide) Material type: Text; Format: print ; Literary form: Not fiction Publication details: Cochin: Cochin University of Science and Technology, 2004 Availability: No items available. Add to cart (remove)

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