Your search returned 4 results.

Results
	1.	VLSI test principles and architectures: design for testability by Wang, laung-Terng [ed.] [ed. by ] Cheng-Wu [ed.] Xiaoqing Wen [ed.] Series: (Morgan Kaufmann series in systems on silicon) Material type: Text; Format: print ; Literary form: Not fiction Publication details: Amsterdam Elsevier 2006 Availability: Items available for loan: University Library (1)Call number: 621.3.049.77 WAN. Add to cart (remove)
	2.	System-on-chip test architectures: nanometer design for testability by Wang, Laung-Terng [ed. by] Stround, Charles E. Touba, Nur A Edition: Material type: Text; Format: large print ; Nature of contents: ; Literary form: Not fiction ; Audience: Juvenile; Publication details: Boston Morgan Kaufmann 2008 Availability: Items available for loan: University Library (1)Call number: 621.9 WAN. Add to cart (remove)
	3.	Genetic algorithms for VLSI design, layout & test automation / Pinaki Mazumder, Elizabeth M. Rudnick. by Mazumder, Pinaki Rudnick, Elizabeth M Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New Delhi, : Pearson, c1999 Availability: Items available for loan: Department of Computer Science (1)Call number: 004.421:63 MAZ. Add to cart (remove)
	4.	Genetic algorithms for VLSI design, layout & test automation / Pinaki Mazumder, Elizabeth M. Rudnick. by Mazumder, Pinaki Rudnick, Elizabeth M Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New Delhi, : Pearson, c1999 Availability: No items available. Add to cart (remove)

University Library
Cochin University of Science and Technology
Kochi-682 022, Kerala, India