| 000 | 00715nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | adlib96000001 | ||
| 003 | ViArRB | ||
| 005 | 20151026130807.0 | ||
| 008 | 960221s1955 dcuabcdjdbkoqu001 0deng d | ||
| 020 | _a | ||
| 022 | _a | ||
| 040 | _aAdlib | ||
| 082 | _a621.3.049.772.2:621.317 | ||
| 245 | _aMeasurement technique for thin films [proceedings] | ||
| 250 | _a | ||
| 260 |
_aNew York _bThe Electrochemical Society _c1967 |
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| 300 |
_avi, 364p. _c |
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| 500 | _a Symposium sponsored by Electronics division of the electrochemical society | ||
| 100 |
_aSchwartz, Bertram _ed. By |
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| 700 |
_aSchwartz, Newton _a |
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| 942 | _cBK | ||
| 653 |
_aMicroelectronics _aElectronics _aSemiconductors _aThin films |
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| 999 |
_c13325 _d13325 |
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