000 | 00588cam a2200169 a 4500 | ||
---|---|---|---|
005 | 20160318124818.0 | ||
008 | 830502s1983 enka b 001 0 eng | ||
082 | 0 | 0 |
_a620.1/1292 _bPRA |
245 | 0 | 0 |
_aPractical surface analysis : _bby auger and x-ray photoelectron spectroscopy / _cedited by D. Briggs and M.P. Seah. |
300 |
_axiv, 533 p. : _bill. ; _c24 cm. |
||
653 |
_aSurfaces (Technology)--Analysis _aElectron spectroscopy |
||
700 | 1 |
_aBriggs, D., ed. _98509 |
|
700 | 1 |
_aSeah, M. P., ed. _98510 |
|
942 | _cBK | ||
260 |
_aNew York : _bWiley, _cc1983. |
||
020 | _a047126279X | ||
999 |
_c147345 _d147345 |