| 000 | 00478cam a2200157u 4500 | ||
|---|---|---|---|
| 005 | 20160318124911.0 | ||
| 008 | 820521s1968 nyua 000 0 eng | ||
| 082 |
_a669/.95/0282 _bBEL |
||
| 100 | 1 |
_aBelk, J. A. _98424 |
|
| 245 | 1 | 0 | _aElectron microscopy and microanalysis of metals. |
| 300 |
_aix, 255 p. with illus. _c23 cm. |
||
| 653 | _aElectron metallography | ||
| 700 | 1 |
_aDavies, A. L., _98423 |
|
| 942 | _cBK | ||
| 260 |
_aNew York [etc.] _bElsevier Pub. Co., _c1968. |
||
| 999 |
_c149046 _d149046 |
||