| 000 | 00509cam a2200157 a 4500 | ||
|---|---|---|---|
| 005 | 20160318124917.0 | ||
| 008 | 950317s1995 maua b 001 0 eng | ||
| 082 | 0 | 0 |
_a621.3815/48 _bAFS |
| 100 | 1 |
_aAfshar, Amir. _95632 |
|
| 245 | 1 | 0 |
_aPrinciples of semiconductor network testing / _cAmir Afshar. |
| 300 |
_axiv, 213 p. : _bill. ; _c25 cm. |
||
| 653 |
_aIntegrated circuits--Testing. _aSemiconductors--Testing. |
||
| 942 | _cBK | ||
| 260 |
_aBoston : _bButterworth-Heinemann, _cc1995. |
||
| 020 | _a0750694726 | ||
| 999 |
_c149260 _d149260 |
||