| 000 | 00866cam a2200205 i 4500 | ||
|---|---|---|---|
| 005 | 20160318124920.0 | ||
| 008 | 810112s1981 nyua b 101 0 eng | ||
| 082 | 0 | 0 |
_a537.6/22 _bNAR |
| 245 | 0 | 0 |
_aDefects in semiconductors : _bproceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. / _ceditors, J. Narayan and T. Y. Tan. |
| 300 |
_axi, 537 p. : _bill. ; _c24 cm. |
||
| 490 | 1 |
_aMaterials Research Society symposia proceedings ; _vv. 2 _x0272-9172 |
|
| 653 | _aSemiconductors--Defects--Congresses. | ||
| 700 | 1 |
_aNarayan, J., ed. _95732 |
|
| 700 | 1 |
_aTan, T. Y., ed. _95733 |
|
| 710 | 2 |
_aMaterials Research Society. _93063 |
|
| 942 | _cBK | ||
| 260 |
_aNew York : _bNorth Holland, _cc1981. |
||
| 020 | _a044400596X | ||
| 830 | 0 |
_aMaterials Research Society symposia proceedings ; _vv. 2. _95734 |
|
| 999 |
_c149331 _d149331 |
||