| 000 | 01024cam a2200193 i 4500 | ||
|---|---|---|---|
| 005 | 20160318124925.0 | ||
| 008 | 801027s1980 nyua b 101 0 eng | ||
| 082 | 0 | 0 |
_a548/.5 _bBRI |
| 245 | 1 | 0 |
_aCharacterization of crystal growth defects by X-ray methods : _b[proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / _cedited by Brian K. Tanner and D. Keith Bowen. |
| 300 |
_axxvi, 589 p. : _bill. ; _c26 cm. |
||
| 653 |
_aCrystals--Defects--Congresses _aX-ray crystallography--Congresses |
||
| 700 | 1 |
_aTanner, B. K ed. _95947 |
|
| 700 | 1 |
_aBowen, D. Keith ed. _95948 |
|
| 942 | _cBK | ||
| 260 |
_aNew York, N.Y. : _bPlenum Press, _cc1980. |
||
| 500 | _a"Published in cooperation with NATO Scientific Affairs Division." | ||
| 020 | _a0306406284 | ||
| 111 | 2 |
_aNATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods _d(1979 : _cDurham, England) _95946 |
|
| 999 |
_c149469 _d149469 |
||