000 | 00574cam a2200181 a 4500 | ||
---|---|---|---|
005 | 20160323130417.0 | ||
008 | 860314s1986 nyua b 001 0 eng | ||
082 | 0 | 0 |
_a545.23 _bJON |
100 | 1 |
_aJones, Alan, _911697 |
|
245 | 1 | 0 |
_aTemperature-programmed reduction for solid materials characterization / _cAlan Jones, Brian McNicol. |
300 |
_aviii, 199 p. : _bill. ; _c24 cm. |
||
653 | _aReduction (Chemistry) | ||
653 | _aMaterials--Analysis | ||
700 | 1 |
_aMcNicol, B. D. _911696 |
|
942 | _cBK | ||
260 |
_aNew York : _bM. Dekker, _cc1986. |
||
020 | _a082477583X | ||
999 |
_c157350 _d157350 |