000 00723pam a2200217 a 4500
003 OSt
008 861120s1987 nyua b 001 0 eng
080 _a681.3.06
_bMUS
100 1 _aMusa, John D.
_96816
245 1 0 _aSoftware reliability :
_bmeasurement, prediction, application /
_cJohn D. Musa, Anthony Iannino, Kazuhira Okumoto.
260 _aNew York :
_bMcGraw-Hill,
_cc1987.
300 _axvii, 621 p. :
_bill. ;
500 _aIncludes indexes.
650 0 _aComputer software
_xTesting.
_96817
650 0 _aComputer software
_xReliability.
_96818
653 _aSoftware reliability
700 1 _aMusa, John D.
_96819
700 1 _aIannino, Anthony.
_96820
700 1 _aOkumoto, Kazuhira.
_96821
942 _cBK
999 _c164191
_d164191