| 000 | 00618nam a22001697a 4500 | ||
|---|---|---|---|
| 999 |
_c220526 _d220526 |
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| 005 | 20220518131246.0 | ||
| 008 | 210220b ||||| |||| 00| 0 eng d | ||
| 020 | _a9788120316836 | ||
| 082 | _a621.39732 | ||
| 100 | _aSharma, K Ashok | ||
| 110 | _aIEEE Press | ||
| 245 |
_aSemiconductor Memories _bTechnology, Testing, and Reliability |
||
| 260 |
_aNew Delhi _bPrentice Hall of India Pvt Ltd |
||
| 300 | _a462p. | ||
| 653 | _aRandom Access Memory Technologies, Nonvolatile Memories, Memory Fault Modeling and Testing, Memory Design for Testability and fault Tolerance, Semiconductor Memory Reilability | ||
| 942 | _cBK | ||