| 000 | 00572nam a22001817a 4500 | ||
|---|---|---|---|
| 999 |
_c220950 _d220950 |
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| 005 | 20220518131414.0 | ||
| 008 | 210303b ||||| |||| 00| 0 eng d | ||
| 020 | _a9780471430797 | ||
| 082 | _a621.38152 | ||
| 100 | _aNicollian, E H | ||
| 245 |
_aMOS(Metal Oxide Semiconductor) _bPhysics and Technology |
||
| 260 |
_aNew Jersey _bJohn Wiley & Sons Inc |
||
| 300 | _a906p. | ||
| 500 | _aWiley Classics Library Edition Published 2003 | ||
| 653 | _aInterfacial Nonuniformities, Extraction of Interface Trap Properties, Field Effect | ||
| 700 | _aBrews, J R | ||
| 942 | _cBK | ||