000 00537nam a22001697a 4500
999 _c220992
_d220992
005 20220518131422.0
008 210303b ||||| |||| 00| 0 eng d
020 _a9780849336829
082 _a670.425
245 _aOptical Inspection of Microsystems
250 _aEdited by Wolfgang Osten
260 _aBoca Raton
_bCRC Press
300 _a503p.
490 _aOptical Science and Engineering
653 _aImage Processing, Optical Profiling Techniques, Grating Interferometry, Measuring MEMS, Laser Doppler Vibrometry
942 _cBK