| 000 | 00566cam a2200181 i 4500 | ||
|---|---|---|---|
| 005 | 20220519104310.0 | ||
| 008 | 751229s1976 nyu b 001 0 eng | ||
| 082 | 0 | 0 |
_a548/.83 _bTAN |
| 100 | 1 |
_aTanner, B. K. _92940 |
|
| 245 | 1 | 0 |
_aX-ray diffraction topography / _cby B. K. Tanner. |
| 300 |
_axiii, 174 p. ; _c26 cm. |
||
| 490 | 0 | _aInternational series in the science of the solid state ; v. 10 | |
| 490 | 0 | _aPergamon international library | |
| 653 | _aX-ray crystallography | ||
| 942 | _cBK | ||
| 260 |
_aNew York : _bPergamon Press, _c1976. |
||
| 020 | _a0080196926 | ||
| 999 |
_c264433 _d264433 |
||