| 000 | 00664cam a2200181 a 4500 | ||
|---|---|---|---|
| 005 | 20220519104435.0 | ||
| 008 | 820728s1982 nyua b 001 0 eng | ||
| 082 | 0 | 0 |
_a502/.8/25 _bMUR |
| 100 | 1 |
_aMurr, Lawrence Eugene. _93591 |
|
| 245 | 1 | 0 |
_aElectron and ion microscopy and microanalysis : _bprinciples and applications / _cLawrence E. Murr. |
| 300 |
_axiv, 793 p. : _bill. ; _c27 cm. |
||
| 490 | 1 |
_aOptical engineering ; _vv. 1 |
|
| 653 |
_aElectron microscopy _aField ion microscopy _aMicroprobe analysis |
||
| 942 | _cBK | ||
| 260 |
_aNew York : _bMarcel Dekker, _cc1982. |
||
| 020 | _a0824715535 | ||
| 830 | 0 |
_aOptical engineering (Marcel Dekker, Inc.) ; _vv. 1. _93590 |
|
| 999 |
_c264849 _d264849 |
||