000			00885cam a2200193 i 4500
005			20220519104852.0
008			780928s1978 ne af b 101 0 eng
082	0	0	_a620.1/127 _bAME
245	0	0	_aDiffraction and imaging techniques in material science / _ceditors, S. Amelinckx, R. Gevers, J. Van Landuyt. _b2v.; v1. electron microscopy, v2. imaging and diffraction techniques
250			_a2d, rev. ed.
300			_a2 v. (xvii, 847 p., [1] fold. leaf of plates) : _bill. ; _c23 cm.
653			_aElectron microscopy--Congresses. _aElectrons--Diffraction--Congresses. _aImaging systems--Congresses.
700	1		_aAmelinckx, S., ed. _95379
700	1		_aGevers, R., ed. _95380
700	1		_aLanduyt, J. van., ed. _95381
942			_cBK
260			_aAmsterdam ; _bNorth-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, _c1978.
020			_a0444851305
999			_c266135 _d266135