000 | 00513nam a22001577a 4500 | ||
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005 | 20220519105810.0 | ||
008 | 110704t xxu||||| |||| 00| 0 eng d | ||
082 | _aPH. D | ||
100 |
_aPaulraj, M. _99035 |
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245 | _aNon-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy | ||
300 | _aPh. D | ||
653 | _aThin film | ||
700 |
_aVijayakumar, K. P (Guide) _98969 |
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942 | _cREF | ||
260 |
_aCochin: _bCochin University of Science and Techonology, _c2004. |
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999 |
_c268275 _d268275 |