000 00503 a2200169 4500
003 OSt
008 090323t xxu||||| |||| 00| 0 eng d
082 _a621.38.049.77
_bCHA
100 _aChakraborty, Kanad
245 _aFault - tolerance and reliability techniques for high density random access memories
300 _a426p.
653 _aIntegrated circuits
_a621.38.049.77
700 _aMazumder, Pinaki
_94932
942 _cBK
_2ddc
260 _aNew Delhi
_bPrentice Hall
_c2002
020 _a8120322142
999 _c332095
_d332095