| 000 | 00703nam a22001937a 4500 | ||
|---|---|---|---|
| 005 | 20151026130334.0 | ||
| 008 | 091021t xxu||||| |||| 00| 0 eng d | ||
| 080 |
_a621.3.049.77 _bWAN |
||
| 100 |
_aWang, laung-Terng [ed.] _eed. by _97817 |
||
| 245 |
_aVLSI test principles and architectures: _bdesign for testability |
||
| 300 | _axxx, 777p. | ||
| 490 | _a(Morgan Kaufmann series in systems on silicon) | ||
| 653 |
_aIntegrated circuits-very large scale integration-testing _aIntegrated circuits-very large scale integration-design |
||
| 700 |
_aCheng-Wu [ed.] _97818 |
||
| 700 |
_aXiaoqing Wen [ed.] _97819 |
||
| 942 | _cBK | ||
| 260 |
_aAmsterdam _bElsevier _c2006 _96900 |
||
| 020 | _a0-12-370597-5 | ||
| 999 |
_c3451 _d3451 |
||