| 000 | 00687nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | adlib96000001 | ||
| 003 | ViArRB | ||
| 005 | 20151026132143.0 | ||
| 008 | 960221s1955 dcuabcdjdbkoqu001 0deng d | ||
| 020 | _a | ||
| 022 | _a | ||
| 040 | _aAdlib | ||
| 082 | _a539.216.2 | ||
| 245 | _aAnalysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements | ||
| 250 | _a | ||
| 260 |
_aKochi _bDepartment of Physics, CUSAT _c2004 |
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| 300 |
_axviii, 182p. _c |
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| 500 | _a Thesis (Ph.D), CUSAT, 2004 | ||
| 100 |
_aRupa R. Pai _e |
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| 700 |
_aSudha Kartha, C. _a |
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| 942 | _cREF | ||
| 653 | _aSemiconducting thin films | ||
| 999 |
_c42767 _d42767 |
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