000 00592nam a2200241 a 4500
001 adlib96000001
003 ViArRB
005 20151026132233.0
008 960221s1955 dcuabcdjdbkoqu001 0deng d
020 _a9780387400907
022 _a
040 _aAdlib
082 _a620.186
245 _aScanning probe microscopy: atomic scale engineering by forces and currents
250 _a
260 _aNew York
_bSpringer
_c2006
300 _axiv, 281p
_c
500 _a
100 _aFoster, A.
_e
700 _aHofer, W.
_a
942 _cBK
653 _aScanning probe microscopy
999 _c44417
_d44417