000 00580nam a22001577a 4500
005 20151026125937.0
008 090805t xxu||||| |||| 00| 0 eng d
080 _a535.8
_bPAU
100 _aPaulraj, M.
_91721
245 _aNon-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
300 _a256p.
653 _aOptics
_aPhotothermal deflection spectroslopy
_aGuide : Vijayakumar, K.P.
942 _cTH
260 _aKochi
_bDept.of Physics - CUSAT
_c2004
_91722
500 _aThesis (Ph.D),CUSAT, 2004 Guide : Vijayakumar, K.P.
999 _c763
_d763