Electron and ion microscopy and microanalysis :
Murr, Lawrence Eugene.
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr. - New York : Marcel Dekker, c1982. - xiv, 793 p. : ill. ; 27 cm. - Optical engineering ; v. 1 . - Optical engineering (Marcel Dekker, Inc.) ; v. 1. .
0824715535
Electron microscopy Field ion microscopy Microprobe analysis
502/.8/25 / MUR
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr. - New York : Marcel Dekker, c1982. - xiv, 793 p. : ill. ; 27 cm. - Optical engineering ; v. 1 . - Optical engineering (Marcel Dekker, Inc.) ; v. 1. .
0824715535
Electron microscopy Field ion microscopy Microprobe analysis
502/.8/25 / MUR