Image from Amazon.com
Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
Material type:
TextSeries: Optical engineering (Marcel Dekker, Inc.) ; v. 1.Publication details: New York : Marcel Dekker, c1982.Description: xiv, 793 p. : ill. ; 27 cmISBN: - 0824715535
- 502/.8/25 MUR
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
|
Department of Physics | 502/.8/25 MUR (Browse shelf(Opens below)) | 1 | Available | PHY007343 | |
|
Books
|
Department of Physics | 502/.8/25 MUR;1 (Browse shelf(Opens below)) | 2 | Available | PHY008124 |
There are no comments on this title.