VLSI test principles and architectures:
Wang, laung-Terng [ed.]
VLSI test principles and architectures: design for testability - Amsterdam Elsevier 2006 - xxx, 777p. - (Morgan Kaufmann series in systems on silicon) .
0-12-370597-5
Integrated circuits-very large scale integration-testing Integrated circuits-very large scale integration-design
621.3.049.77 / WAN
VLSI test principles and architectures: design for testability - Amsterdam Elsevier 2006 - xxx, 777p. - (Morgan Kaufmann series in systems on silicon) .
0-12-370597-5
Integrated circuits-very large scale integration-testing Integrated circuits-very large scale integration-design
621.3.049.77 / WAN