VLSI test principles and architectures: (Record no. 3451)

MARC details
000 -LEADER
fixed length control field 00703nam a22001937a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20151026130334.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 091021t xxu||||| |||| 00| 0 eng d
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 621.3.049.77
Item number WAN
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0-12-370597-5
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Wang, laung-Terng [ed.]
Relator term ed. by
9 (RLIN) 7817
245 ## - TITLE STATEMENT
Title VLSI test principles and architectures:
Remainder of title design for testability
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Amsterdam
Name of publisher, distributor, etc. Elsevier
Date of publication, distribution, etc. 2006
-- 6900
300 ## - PHYSICAL DESCRIPTION
Extent xxx, 777p.
490 ## - SERIES STATEMENT
Series statement (Morgan Kaufmann series in systems on silicon)
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Integrated circuits-very large scale integration-testing
-- Integrated circuits-very large scale integration-design
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Cheng-Wu [ed.]
9 (RLIN) 7818
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Xiaoqing Wen [ed.]
9 (RLIN) 7819
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Date last checked out Price effective from Koha item type
    Universal Decimal Classification     University Library University Library 10/21/2009 1 621.3.049.77 WAN 00056985 06/17/2011 06/03/2011 10/21/2009 Books

University Library
Cochin University of Science and Technology
Kochi-682 022, Kerala, India