Electron and ion microscopy and microanalysis : (Record no. 264849)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00664cam a2200181 a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220519104435.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 820728s1982 nyua b 001 0 eng |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502/.8/25 |
| Item number | MUR |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0824715535 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Murr, Lawrence Eugene. |
| 9 (RLIN) | 3591 |
| 245 10 - TITLE STATEMENT | |
| Title | Electron and ion microscopy and microanalysis : |
| Remainder of title | principles and applications / |
| Statement of responsibility, etc. | Lawrence E. Murr. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York : |
| Name of publisher, distributor, etc. | Marcel Dekker, |
| Date of publication, distribution, etc. | c1982. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xiv, 793 p. : |
| Other physical details | ill. ; |
| Dimensions | 27 cm. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Optical engineering ; |
| Volume/sequential designation | v. 1 |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Electron microscopy |
| -- | Field ion microscopy |
| -- | Microprobe analysis |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | Optical engineering (Marcel Dekker, Inc.) ; |
| Volume number/sequential designation | v. 1. |
| 9 (RLIN) | 3590 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
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