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Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.

By: Material type: TextTextSeries: Optical engineering (Marcel Dekker, Inc.) ; v. 1.Publication details: New York : Marcel Dekker, c1982.Description: xiv, 793 p. : ill. ; 27 cmISBN:
  • 0824715535
Subject(s): DDC classification:
  • 502/.8/25 MUR
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Cochin University of Science and Technology
Kochi-682 022, Kerala, India