Random testing of digital circuits (Record no. 330516)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 00410 a2200145 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0-8247-0182-8 |
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
Universal Decimal Classification number | 621.3815 |
Item number | DAV |
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) | |
-- | 160 |
-- | 160 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | David, Rene |
245 ## - TITLE STATEMENT | |
Title | Random testing of digital circuits |
Remainder of title | theory and applications |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | New York |
Name of publisher, distributor, etc. | Marcel Dekker |
Date of publication, distribution, etc. | 1998 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xix, 475p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | 621.3815 |
General subdivision | Digital integrated circuits - testing |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Closed Reference |
Call number prefix | 621.3815 DAV |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Total Checkouts | Barcode | Date last seen | Uniform Resource Identifier | Price effective from | Koha item type |
---|---|---|---|---|---|---|---|---|---|---|---|---|
Dewey Decimal Classification | School of Engineering | School of Engineering | SE8227 | 02/02/2009 | 530 | 02/02/2009 | Closed Reference |