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Random testing of digital circuits theory and applications

By:

David, Rene

Publication details: New York Marcel Dekker 1998Description: xix, 475pISBN:

0-8247-0182-8

Subject(s):

621.3815 -- Digital integrated circuits - testing

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Item type	Current library	Call number	URL	Status	Date due	Barcode
Closed Reference	School of Engineering		Link to resource	Not for loan		SE8227

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University Library
Cochin University of Science and Technology
Kochi-682 022, Kerala, India