Digital circuit testing: a guide to DFT and other techniques
Material type:
TextPublication details: San Diego Academic Press 1991 Description: xi, 233p
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University Library | 621.3.049.77 WANG (Browse shelf(Opens below)) | Available | 00039980 |
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| 621.3.049.77 VOR Fast analytical techniques for electrical and electronic circuits | 621.3.049.77 WAN VLSI test principles and architectures: | 621.3.049.77 WAN Trouble shooting solid state circuits and systems | 621.3.049.77 WANG Digital circuit testing: | 621.3.049.77 WAS Nanoelectronics and information technology | 621.3.049.77 WHI Microelectronics | 621.3.049.77 WOJ Integrated circuits |
Ref. at the end of each chap.
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