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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

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TextPublication details: Kochi Department of Physics, CUSAT 2004Edition: Description: xviii, 182pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Reference	University Library	539.216.2 RUP (Browse shelf(Opens below))	Not for loan		G0008659

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Thesis (Ph.D), CUSAT, 2004

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