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In situ characterization of thin film growth Gertjan Koster and Guus Rijnders

By:

Koster, Gertjan [Ed. by]

Contributor(s):

Rijnders, Guus; ed.by

Series: Woodhead publishing in materialsPublication details: Woodhead Publishing 2011 Cambridge Description: xi, 282pISBN:

9781845699345

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Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	539.216 KOS (Browse shelf(Opens below))	Available		00067817

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Previous	539.216 ALD T Preparation and characterisation of certain II-VI, I-III-VI2 semiconductor thin films and transparent conducting oxides (Thesis)	539.216 CAO Thin film growth	539.216 JAY T Defect analysis of semiconductor thin films for photovoltaic applications using photo-luminescence and photo-conductivity	539.216 KOS In situ characterization of thin film growth	539.216 NIS T Growth and characterisation of radio frequency magnetron sputtered indium tin oxide thin films	539.216 OKU Ferroelectric thin films:basic properties and device physics for memory applications	539.216 ORG Organic thin films: structure and applications	Next

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