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Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / edited by J. Donecker and I. Rechneberg. by
  • Donecker, J., ed
  • Rechenberg, I., ed
  • International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany)
Series: Institute of physics series ; no. 160
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bristol ; Institute of Physics Pub., 1998
Availability: Items available for loan: Department of Physics (1)Call number: 621.3815/2 DON.

2.
Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / edited by J. Donecker and I. Rechneberg. by
  • Donecker, J., ed
  • Rechenberg, I., ed
  • International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany)
Series: Institute of physics series ; no. 160
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Bristol ; Institute of Physics Pub., 1998
Availability: No items available.

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