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	1.	Nanoscale spectroscopy and its applications to semiconductor research by Watanabe, Y. [ed.] [ed.by] Series: ( Lecture notes in physics ) Material type: Text; Format: print ; Literary form: Not fiction Publication details: Berlin Springer 2002 Availability: Items available for loan: University Library (1)Call number: 535.33 WAT. Add to cart (remove)
	2.	Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2v.; v1. electron microscopy, v2. imaging and diffraction techniques by Amelinckx, S., ed Gevers, R., ed Landuyt, J. van., ed Edition: 2d, rev. ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Amsterdam ; North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978 Availability: Items available for loan: Department of Physics (2)Call number: 620.1/127 AME.2, ... Add to cart (remove)
	3.	Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2v.; v1. electron microscopy, v2. imaging and diffraction techniques by Amelinckx, S., ed Gevers, R., ed Landuyt, J. van., ed Edition: 2d, rev. ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Amsterdam ; North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978 Availability: No items available. Add to cart (remove)

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