Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2v.; v1. electron microscopy, v2. imaging and diffraction techniques
Material type: TextPublication details: Amsterdam ; North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.Edition: 2d, rev. edDescription: 2 v. (xvii, 847 p., [1] fold. leaf of plates) : ill. ; 23 cmISBN:- 0444851305
- 620.1/127 AME
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